On-chip built-in test and operational qualification

On-chip built-in test and operational qualification

Operational and functional testing of the optical Physical Media Dependent Integrated Circuits ("PMD ICs") is achieved by constructing a switchable on-chip load with similar or equivalent electrical characteristics of a targeted photonic device.

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Bibliographische Detailangaben
Hauptverfasser: DAVIS, MICHAEL EUGENE, CHOU, WUUN, MCCLAY, CHARLES PHILLIP
Format: Patent
Sprache:chi ; eng
Schlagworte:
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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Beschreibung
Zusammenfassung:Operational and functional testing of the optical Physical Media Dependent Integrated Circuits ("PMD ICs") is achieved by constructing a switchable on-chip load with similar or equivalent electrical characteristics of a targeted photonic device.