Memory elements having conductive cap layers and methods therefor

A memory element can include a first electrode; at least one switching layer formed over the first electrode; a second electrode layer; and at least one conductive cap layer formed over the second electrode layer having substantially no grain boundaries extending through to the second electrode laye...

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Bibliographische Detailangaben
Hauptverfasser: TSAI, KUEI CHANG, SHIELDS, JEFFREY ALLAN, JAMESON, III
Format: Patent
Sprache:chi ; eng
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Beschreibung
Zusammenfassung:A memory element can include a first electrode; at least one switching layer formed over the first electrode; a second electrode layer; and at least one conductive cap layer formed over the second electrode layer having substantially no grain boundaries extending through to the second electrode layer; wherein the at least one switching layer is programmable between different impedance states by application of electric fields via that first and second electrode.