Test method and automatic test equipment thereof

A testing method is applied in Automatic Test Equipment (ATE) to test a plurality of pins of an object to be tested. The ATE includes a plurality of testing groups. Every testing group including a plurality of Per Pin Parametric Measurement units (PPMU) corresponds to an Analog-to-digital converter (ADC). The testing method comprises the following steps. A first control unit selects a sorting table of each testing group according to the selection signal. The first control unit loads a testing parameter of the PPMU according to the sorting table. The PPMU repeatedly conducts pin testing to the pins of the object to be tested according to the testing parameter, for obtaining testing signals. The ADC converts the testing signals to testing values. A second control unit obtains the testing value. A computing unit calculates the average of the testing values.