Memory socket for examining temperature characteristic

This invention relates to a memory socket for examining temperature characteristic, including a pin block provided with an installation part for installing a memory; a printed circuit board provided with a socket part for being inserted with a spring probe set on the pin block, wherein a gap is form...

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Bibliographische Detailangaben
1. Verfasser: JEONG, WOO-YOEL
Format: Patent
Sprache:chi ; eng
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Beschreibung
Zusammenfassung:This invention relates to a memory socket for examining temperature characteristic, including a pin block provided with an installation part for installing a memory; a printed circuit board provided with a socket part for being inserted with a spring probe set on the pin block, wherein a gap is formed between the pin block and the printed circuit board; a polyimide film pressing against the bottom of the pin block for preventing a gap from occurring between the pin block and the printed circuit board; and a pressing block set above the pin block and pressing the memory by lifting and descending the installation part.