System and method for inspection of electrical circuits
A system for inspection of electrical circuits including a defect detection subsystem and an additional subsystem operative other than during inspection to apply a time varying voltage to an electrical circuit subject to inspection and to sense differences in an electrical state at various different...
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| Hauptverfasser: | , |
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| Format: | Patent |
| Sprache: | chi ; eng |
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| Online-Zugang: | Volltext bestellen |
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| Zusammenfassung: | A system for inspection of electrical circuits including a defect detection subsystem and an additional subsystem operative other than during inspection to apply a time varying voltage to an electrical circuit subject to inspection and to sense differences in an electrical state at various different potential defect locations in the electrical circuit. |
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