Resin composition for photoimprinting, patterning method and etching mask

Provided is a resin composition for photoimprinting, the cured products of which have superior etch resistance and heat resistance, and a patterning method using same. A resin composition for photoimprinting comprising a photocurable monomer (A), a photocurable monomer (B), and a photopolymerization...

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Bibliographische Detailangaben
Hauptverfasser: SATSUKA, TAKURO, FUTAESAKU, NORIO, HAYASHIDA, YOSHIHISA, TAKEMORI, TOSHIFUMI, IKEDA, TERUYO
Format: Patent
Sprache:chi ; eng
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Zusammenfassung:Provided is a resin composition for photoimprinting, the cured products of which have superior etch resistance and heat resistance, and a patterning method using same. A resin composition for photoimprinting comprising a photocurable monomer (A), a photocurable monomer (B), and a photopolymerization initiator (C), wherein the photocurable monomer (A) is at least one kind of carbazole compound represented by formula (1), the photocurable monomer (B) contains at least one of the compounds represented by formulas (2), (3) and (4), and the weight ratio of the photocurable monomer (A) to the photocurable monomer (B) (weight of photocurable monomer (A)/weight of photocurable monomer (B)) is 30/70 - 87/13. Formula (1): (R1 represents -CH=CH2, etc. and R2 and R3 represent hydrogen, etc.) Formula (2): (R4 and R5 represent -O-CH=CH2, etc. and R6 and R7 represent hydrogen, etc.) Formula (3): (X is -O-CH=CH2, etc. and A1 - A4 are hydrogen atoms, etc. m, n and o represent 0 or 1.) Formula (4): (R8 and R9 represent -O-CH=C