Methods of forming pattern structures and methods of manufacturing memory devices using the same

Methods of forming pattern structures and methods of manufacturing memory devices using the same are provided, the methods of forming pattern structures include forming an etching object layer on a substrate and performing a plasma reactive etching process on the etching object layer using an etchin...

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Bibliographische Detailangaben
Hauptverfasser: EOM, KYOUNG-HA, RYU, YONG-HWAN, HWANG, JAE-SEUNG, KWON, SUNG-UN
Format: Patent
Sprache:chi ; eng
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Zusammenfassung:Methods of forming pattern structures and methods of manufacturing memory devices using the same are provided, the methods of forming pattern structures include forming an etching object layer on a substrate and performing a plasma reactive etching process on the etching object layer using an etching gas including at least ammonia (NH3) gas. The etching object layer includes a magnetic material or a phase change material.