Dynamic measurement method and apparatus for parameters of saw cutters
This invention is concerned with dynamic measurement method and apparatus for parameters of saw cutters. There are a measurement device, an image processing module and a controller. The measurement device includes a stage, a fixture and a image acquisition module. The image processing module is conn...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | This invention is concerned with dynamic measurement method and apparatus for parameters of saw cutters. There are a measurement device, an image processing module and a controller. The measurement device includes a stage, a fixture and a image acquisition module. The image processing module is connected with the measurement device. A computer of the measurement device is linked to the image acquisition module and an image processing program and a measurement program have been installed in the computer. The controller is coupled with the computer such that image processing module can delivery signals to the controller and the fixture and the image acquisition module can be actuated. By the systematic integration, a fast and high precision dynamic measurement method and apparatus for parameters of saw cutters can be realized. |
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