Semiconductor test equipment with concentric circle pogo towers

A semiconductor test equipment with concentric circle pogo towers is disclosed, which comprises a base, a tester head, an outer pogo tower, and an inner pogo tower. The inner pogo tower is sleeved into the outer pogo tower, and the connecting slot of the inner pogo tower is correspondingly engaged with the connecting pin of the outer pogo tower. Both of the inner pogo tower and outer pogo tower are all installed on a load board of the tester head, whereby a plurality of outer pogo pins of the outer pogo tower and a plurality of inner pogo pins of the inner pogo tower are respectiveiy electrically connected to the load board. Therefore, due to the combination or separation of the inner pogo tower and outer pogo tower, it is capable of expanding its testing scale, and it can change rapidly from different testing scale through changing a different probe card but without to modify any other hardware.