A lithographic apparatus, a method of controlling the apparatus and a device manufacturing method

A method of operating a lithographic apparatus is disclosed. The method includes moving a substrate table supporting a substrate relative to a projection system and adjusting the scanning speed between the substrate table and the projection system during imaging of a target within a predefined area...

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Hauptverfasser: RIEPEN, MICHEL, SHULEPOV, SERGEI, MULKENS, JOHANNES CATHARINUS HUBERTUS, MA, ZHEN-HUA, EVANGELISTA, FABRIZIO, BESSEMS, DAVID, EUMMELEN, ERIK HENRICUS EGIDIUS CATHARINA, STAVENGA, MARCO KOERT, WITBERG, ERIK, CROMWIJK, JAN WILLEM, KEMPER, NICOLAAS RUDOLF, GUNTER, PIETER LEIN JOSEPH, BRANDS, GERT-JAN GERARDUS JOHANNES THOMAS, JOSEN, MARINUS, MEIJERS, RALPH JOSEPH, BELL, FRANCISCUS WILHELMUS, LEENDERS, MARTINUS HENDRIKUS ANTONIUS, LIEBREGTS, PAULUS MARTINUS MARIA, MOERMAN, RICHARD, SMITS, MARCUS AGNES JOHANNES, LI, HUA, STEFFENS, KOEN
Format: Patent
Sprache:chi ; eng
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Zusammenfassung:A method of operating a lithographic apparatus is disclosed. The method includes moving a substrate table supporting a substrate relative to a projection system and adjusting the scanning speed between the substrate table and the projection system during imaging of a target within a predefined area at or near an edge of the substrate, or adjusting the stepping speed between adjacent target positions in a predefined area at or near the edge of the substrate, or both. The adjusting the scanning and/or stepping speed may comprise lowering the speed. The projection system is configured to project a patterned beam of radiation on to a target portion of the substrate.