Dynamic test apparatus and method
The present invention is directed to dynamic test apparatus and method. A container (e.g., a socket) and a controller (e.g., a micro controller) are set on a device interface board (DIB). The container holds a device under test (DUT), and the controller dynamically collects the output signals of the...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | The present invention is directed to dynamic test apparatus and method. A container (e.g., a socket) and a controller (e.g., a micro controller) are set on a device interface board (DIB). The container holds a device under test (DUT), and the controller dynamically collects the output signals of the DUT, and accordingly obtains values (such as accelerations) representing movement status. |
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