Integrity check method applied to electronic device and circuit for performing integrity check in electronic device

Integrity check method applied to electronic device and circuit for performing integrity check in electronic device

An integrity check method applied to an electronic device includes: fetching at least one portion of external data into a specific memory, where the external data is stored within the electronic device; during fetching the portion of the external data into the specific memory, checking whether the s...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: CHANG, YAO-DUN, HSU, CHIUN, CHEN, PING-SHENG, CHAO, MING-YANG, WU, TSE-HONG
Format: Patent
Sprache:chi ; eng
Schlagworte:
INFORMATION STORAGE
PHYSICS
STATIC STORES
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Beschreibung
Zusammenfassung:An integrity check method applied to an electronic device includes: fetching at least one portion of external data into a specific memory, where the external data is stored within the electronic device; during fetching the portion of the external data into the specific memory, checking whether the size of the fetched data in the specific memory reaches a predetermined value, where the predetermined value is less than the total size of the external data; and when the size of the fetched data in the specific memory reaches the predetermined value, enabling an integrity check of the fetched data.