Method for revising/repairing a projection objective of a lithography projection expose apparatus and such projection objective

A method for revising/repairing a projection objective of a lithography projection exposure apparatus, the projection objective comprising a plurality of optical elements between an object plane and an image plane, the plurality of optical elements comprising at least one first optical element havin...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: HAEUSSLER, JOCHEN, PETASCH, THOMAS, ROGALSKY, OLAF, BITTNER, BORIS
Format: Patent
Sprache:chi ; eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page
container_issue
container_start_page
container_title
container_volume
creator HAEUSSLER, JOCHEN
PETASCH, THOMAS
ROGALSKY, OLAF
BITTNER, BORIS
description A method for revising/repairing a projection objective of a lithography projection exposure apparatus, the projection objective comprising a plurality of optical elements between an object plane and an image plane, the plurality of optical elements comprising at least one first optical element having a refractive power, comprises, without exchanging all of the optical elements, removing the at least one first optical element from the projection objective in the field, inserting at least one first spare optical element into the projection objective at the location of the at least one first optical element, and adjusting an image quality of the projection objective to a desired quality.
format Patent
fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_TW200823603A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>TW200823603A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_TW200823603A3</originalsourceid><addsrcrecordid>eNqNjLEKwkAQRNNYiPoP6weIIQGxFVFs7AKWYb1scifhdtm7BK38dQ-xsLCwmgfzZqbZ80zRcgMtKyiNLjjfrZUEnSYCBFG-kYmOPfD1TSMBt6npXVp2imIf3xbdhQMBiqBiHAKgbyAMxv68mmeTFvtAi0_OsuXxUO1PKxKuKQga8hTr6lLk-bYoN3m5K_9xXoMHSiM</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Method for revising/repairing a projection objective of a lithography projection expose apparatus and such projection objective</title><source>esp@cenet</source><creator>HAEUSSLER, JOCHEN ; PETASCH, THOMAS ; ROGALSKY, OLAF ; BITTNER, BORIS</creator><creatorcontrib>HAEUSSLER, JOCHEN ; PETASCH, THOMAS ; ROGALSKY, OLAF ; BITTNER, BORIS</creatorcontrib><description>A method for revising/repairing a projection objective of a lithography projection exposure apparatus, the projection objective comprising a plurality of optical elements between an object plane and an image plane, the plurality of optical elements comprising at least one first optical element having a refractive power, comprises, without exchanging all of the optical elements, removing the at least one first optical element from the projection objective in the field, inserting at least one first spare optical element into the projection objective at the location of the at least one first optical element, and adjusting an image quality of the projection objective to a desired quality.</description><language>chi ; eng</language><subject>APPARATUS SPECIALLY ADAPTED THEREFOR ; CINEMATOGRAPHY ; ELECTROGRAPHY ; HOLOGRAPHY ; MATERIALS THEREFOR ; ORIGINALS THEREFOR ; PHOTOGRAPHY ; PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES,e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTORDEVICES ; PHYSICS</subject><creationdate>2008</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20080601&amp;DB=EPODOC&amp;CC=TW&amp;NR=200823603A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20080601&amp;DB=EPODOC&amp;CC=TW&amp;NR=200823603A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>HAEUSSLER, JOCHEN</creatorcontrib><creatorcontrib>PETASCH, THOMAS</creatorcontrib><creatorcontrib>ROGALSKY, OLAF</creatorcontrib><creatorcontrib>BITTNER, BORIS</creatorcontrib><title>Method for revising/repairing a projection objective of a lithography projection expose apparatus and such projection objective</title><description>A method for revising/repairing a projection objective of a lithography projection exposure apparatus, the projection objective comprising a plurality of optical elements between an object plane and an image plane, the plurality of optical elements comprising at least one first optical element having a refractive power, comprises, without exchanging all of the optical elements, removing the at least one first optical element from the projection objective in the field, inserting at least one first spare optical element into the projection objective at the location of the at least one first optical element, and adjusting an image quality of the projection objective to a desired quality.</description><subject>APPARATUS SPECIALLY ADAPTED THEREFOR</subject><subject>CINEMATOGRAPHY</subject><subject>ELECTROGRAPHY</subject><subject>HOLOGRAPHY</subject><subject>MATERIALS THEREFOR</subject><subject>ORIGINALS THEREFOR</subject><subject>PHOTOGRAPHY</subject><subject>PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES,e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTORDEVICES</subject><subject>PHYSICS</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2008</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNqNjLEKwkAQRNNYiPoP6weIIQGxFVFs7AKWYb1scifhdtm7BK38dQ-xsLCwmgfzZqbZ80zRcgMtKyiNLjjfrZUEnSYCBFG-kYmOPfD1TSMBt6npXVp2imIf3xbdhQMBiqBiHAKgbyAMxv68mmeTFvtAi0_OsuXxUO1PKxKuKQga8hTr6lLk-bYoN3m5K_9xXoMHSiM</recordid><startdate>20080601</startdate><enddate>20080601</enddate><creator>HAEUSSLER, JOCHEN</creator><creator>PETASCH, THOMAS</creator><creator>ROGALSKY, OLAF</creator><creator>BITTNER, BORIS</creator><scope>EVB</scope></search><sort><creationdate>20080601</creationdate><title>Method for revising/repairing a projection objective of a lithography projection expose apparatus and such projection objective</title><author>HAEUSSLER, JOCHEN ; PETASCH, THOMAS ; ROGALSKY, OLAF ; BITTNER, BORIS</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_TW200823603A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng</language><creationdate>2008</creationdate><topic>APPARATUS SPECIALLY ADAPTED THEREFOR</topic><topic>CINEMATOGRAPHY</topic><topic>ELECTROGRAPHY</topic><topic>HOLOGRAPHY</topic><topic>MATERIALS THEREFOR</topic><topic>ORIGINALS THEREFOR</topic><topic>PHOTOGRAPHY</topic><topic>PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES,e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTORDEVICES</topic><topic>PHYSICS</topic><toplevel>online_resources</toplevel><creatorcontrib>HAEUSSLER, JOCHEN</creatorcontrib><creatorcontrib>PETASCH, THOMAS</creatorcontrib><creatorcontrib>ROGALSKY, OLAF</creatorcontrib><creatorcontrib>BITTNER, BORIS</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>HAEUSSLER, JOCHEN</au><au>PETASCH, THOMAS</au><au>ROGALSKY, OLAF</au><au>BITTNER, BORIS</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Method for revising/repairing a projection objective of a lithography projection expose apparatus and such projection objective</title><date>2008-06-01</date><risdate>2008</risdate><abstract>A method for revising/repairing a projection objective of a lithography projection exposure apparatus, the projection objective comprising a plurality of optical elements between an object plane and an image plane, the plurality of optical elements comprising at least one first optical element having a refractive power, comprises, without exchanging all of the optical elements, removing the at least one first optical element from the projection objective in the field, inserting at least one first spare optical element into the projection objective at the location of the at least one first optical element, and adjusting an image quality of the projection objective to a desired quality.</abstract><oa>free_for_read</oa></addata></record>
fulltext fulltext_linktorsrc
identifier
ispartof
issn
language chi ; eng
recordid cdi_epo_espacenet_TW200823603A
source esp@cenet
subjects APPARATUS SPECIALLY ADAPTED THEREFOR
CINEMATOGRAPHY
ELECTROGRAPHY
HOLOGRAPHY
MATERIALS THEREFOR
ORIGINALS THEREFOR
PHOTOGRAPHY
PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES,e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTORDEVICES
PHYSICS
title Method for revising/repairing a projection objective of a lithography projection expose apparatus and such projection objective
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-05T03%3A04%3A44IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=HAEUSSLER,%20JOCHEN&rft.date=2008-06-01&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3ETW200823603A%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true