Low temperature epitaxial growth of silicon-containing films using UV radiation

A method of preparing a clean substrate surface for blanket or selective epitaxial deposition of silicon-containing and/or germanium-containing films. In addition, a method of growing the silicon-containing and/or germanium-containing films, where both the substrate cleaning method and the film grow...

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Bibliographische Detailangaben
Hauptverfasser: SINGH, KAUSHAL K, CARISON, DAVID, KUPPURAO, SATHEESH, THAKUR, RANDHIR, HEMKAR, MANISH
Format: Patent
Sprache:chi ; eng
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Beschreibung
Zusammenfassung:A method of preparing a clean substrate surface for blanket or selective epitaxial deposition of silicon-containing and/or germanium-containing films. In addition, a method of growing the silicon-containing and/or germanium-containing films, where both the substrate cleaning method and the film growth method are carried out at a temperature below 750 DEG C, and typically at a temperature from about 700 DEG C to about 500 DEG C. The cleaning method and the film growth method employ the use of radiation having a wavelength ranging from about 310 nm to about 120 nm in the processing volume in which the silicon-containing film is grown. Use of this radiation in combination with particular partial pressure ranges for the reactive cleaning or film-forming component species enable the substrate cleaning and epitaxial film growth at temperatures below those previously known in the industry.