Method for detecting defectives in an integrated circuit
A method for detecting defectives in an integrated circuit that is composed of a plurality of transistors in parallel. The method includes the following steps: applying a bias to the plurality of transistors in parallel; and catching the infrared imagery of the plurality of transistors.
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| Format: | Patent |
| Sprache: | chi ; eng |
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| Zusammenfassung: | A method for detecting defectives in an integrated circuit that is composed of a plurality of transistors in parallel. The method includes the following steps: applying a bias to the plurality of transistors in parallel; and catching the infrared imagery of the plurality of transistors. |
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