DEVICE FOR MEASURING THICKNESS OF METAL-BASED FILMS

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Hauptverfasser:	SHESTOV VIKTOR P,SU, BELIK VLADIMIR A,SU, STUPAK VLADIMIR A,SU, KORZHAVYJ ALEKSEJ P,SU, FAJFER SERGEJ I,SU, BAZHIN ANATOLIJ I,SU, KULAKOV MIKHAIL M,SU, KAMENTSEV VALERIJ E,SU
Format:	Patent
Sprache:	eng
Schlagworte:	MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS TESTING
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creator	SHESTOV VIKTOR P,SU BELIK VLADIMIR A,SU STUPAK VLADIMIR A,SU KORZHAVYJ ALEKSEJ P,SU FAJFER SERGEJ I,SU BAZHIN ANATOLIJ I,SU KULAKOV MIKHAIL M,SU KAMENTSEV VALERIJ E,SU
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language	eng
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subjects	MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS TESTING
title	DEVICE FOR MEASURING THICKNESS OF METAL-BASED FILMS
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