DEVICE FOR ELECTROLUMINISCENT MEASUREMENTS OF OUTER QUANT YIELD OF RADIATING SEMICONDUCTOR STRUCTURES

Bibliographische Detailangaben

Hauptverfasser:	BONDAR S.A.,SU, AGAFONOV V.G.,SU, ERMAKOVA A.N.,SU, LEBEDEVA L.V.,SU, GARBUZOV D.Z.,SU
Format:	Patent
Sprache:	eng
Schlagworte:	BASIC ELECTRIC ELEMENTS ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS SEMICONDUCTOR DEVICES TESTING
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