METHOD AND DEVICE FOR ANALYZED ELEMENT SPECIMEN ANALYTICAL LINE SEPARATION FROM HE BACKGROUND OF INTERFERING LINES

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Hauptverfasser: KRAMPIT IGOR A,SU, ZHABIN EVGENIJ G,SU, ISAEV DMITRIJ V,SU, SMIRNOV VASILIJ N,SU, KOZLOV GENNADIJ G,SU, BETIN YURIJ P,SU, KOMOV ANATOLIJ P,SU, KORNYSHEV ANATOLIJ P,SU
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creator KRAMPIT IGOR A,SU
ZHABIN EVGENIJ G,SU
ISAEV DMITRIJ V,SU
SMIRNOV VASILIJ N,SU
KOZLOV GENNADIJ G,SU
BETIN YURIJ P,SU
KOMOV ANATOLIJ P,SU
KORNYSHEV ANATOLIJ P,SU
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fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_SU842523A1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>SU842523A1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_SU842523A13</originalsourceid><addsrcrecordid>eNqFjMEKwjAQRHvxIOo3uD_gwVbB65ps2sU0KUkq6KUUiSfRYv1_DOrd08zwZmaaPWsKlZWARoKkIwsCZV2KqE9nkkCaajIBfEOCk_uSwAI1aDYEnhp0GNgaUM7WUBHsURxKZ9t0aRWwCeQUOTblZ-Hn2eTa38a4-OksWyoKolrF4dHFcegv8R5fnW93m3ybF7gu_jfeOKs3ZA</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>METHOD AND DEVICE FOR ANALYZED ELEMENT SPECIMEN ANALYTICAL LINE SEPARATION FROM HE BACKGROUND OF INTERFERING LINES</title><source>esp@cenet</source><creator>KRAMPIT IGOR A,SU ; ZHABIN EVGENIJ G,SU ; ISAEV DMITRIJ V,SU ; SMIRNOV VASILIJ N,SU ; KOZLOV GENNADIJ G,SU ; BETIN YURIJ P,SU ; KOMOV ANATOLIJ P,SU ; KORNYSHEV ANATOLIJ P,SU</creator><creatorcontrib>KRAMPIT IGOR A,SU ; ZHABIN EVGENIJ G,SU ; ISAEV DMITRIJ V,SU ; SMIRNOV VASILIJ N,SU ; KOZLOV GENNADIJ G,SU ; BETIN YURIJ P,SU ; KOMOV ANATOLIJ P,SU ; KORNYSHEV ANATOLIJ P,SU</creatorcontrib><language>eng</language><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; PHYSICS ; TESTING</subject><creationdate>1981</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=19810630&amp;DB=EPODOC&amp;CC=SU&amp;NR=842523A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76289</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=19810630&amp;DB=EPODOC&amp;CC=SU&amp;NR=842523A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>KRAMPIT IGOR A,SU</creatorcontrib><creatorcontrib>ZHABIN EVGENIJ G,SU</creatorcontrib><creatorcontrib>ISAEV DMITRIJ V,SU</creatorcontrib><creatorcontrib>SMIRNOV VASILIJ N,SU</creatorcontrib><creatorcontrib>KOZLOV GENNADIJ G,SU</creatorcontrib><creatorcontrib>BETIN YURIJ P,SU</creatorcontrib><creatorcontrib>KOMOV ANATOLIJ P,SU</creatorcontrib><creatorcontrib>KORNYSHEV ANATOLIJ P,SU</creatorcontrib><title>METHOD AND DEVICE FOR ANALYZED ELEMENT SPECIMEN ANALYTICAL LINE SEPARATION FROM HE BACKGROUND OF INTERFERING LINES</title><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASURING</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>1981</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNqFjMEKwjAQRHvxIOo3uD_gwVbB65ps2sU0KUkq6KUUiSfRYv1_DOrd08zwZmaaPWsKlZWARoKkIwsCZV2KqE9nkkCaajIBfEOCk_uSwAI1aDYEnhp0GNgaUM7WUBHsURxKZ9t0aRWwCeQUOTblZ-Hn2eTa38a4-OksWyoKolrF4dHFcegv8R5fnW93m3ybF7gu_jfeOKs3ZA</recordid><startdate>19810630</startdate><enddate>19810630</enddate><creator>KRAMPIT IGOR A,SU</creator><creator>ZHABIN EVGENIJ G,SU</creator><creator>ISAEV DMITRIJ V,SU</creator><creator>SMIRNOV VASILIJ N,SU</creator><creator>KOZLOV GENNADIJ G,SU</creator><creator>BETIN YURIJ P,SU</creator><creator>KOMOV ANATOLIJ P,SU</creator><creator>KORNYSHEV ANATOLIJ P,SU</creator><scope>EVB</scope></search><sort><creationdate>19810630</creationdate><title>METHOD AND DEVICE FOR ANALYZED ELEMENT SPECIMEN ANALYTICAL LINE SEPARATION FROM HE BACKGROUND OF INTERFERING LINES</title><author>KRAMPIT IGOR A,SU ; ZHABIN EVGENIJ G,SU ; ISAEV DMITRIJ V,SU ; SMIRNOV VASILIJ N,SU ; KOZLOV GENNADIJ G,SU ; BETIN YURIJ P,SU ; KOMOV ANATOLIJ P,SU ; KORNYSHEV ANATOLIJ P,SU</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_SU842523A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>1981</creationdate><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASURING</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>KRAMPIT IGOR A,SU</creatorcontrib><creatorcontrib>ZHABIN EVGENIJ G,SU</creatorcontrib><creatorcontrib>ISAEV DMITRIJ V,SU</creatorcontrib><creatorcontrib>SMIRNOV VASILIJ N,SU</creatorcontrib><creatorcontrib>KOZLOV GENNADIJ G,SU</creatorcontrib><creatorcontrib>BETIN YURIJ P,SU</creatorcontrib><creatorcontrib>KOMOV ANATOLIJ P,SU</creatorcontrib><creatorcontrib>KORNYSHEV ANATOLIJ P,SU</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>KRAMPIT IGOR A,SU</au><au>ZHABIN EVGENIJ G,SU</au><au>ISAEV DMITRIJ V,SU</au><au>SMIRNOV VASILIJ N,SU</au><au>KOZLOV GENNADIJ G,SU</au><au>BETIN YURIJ P,SU</au><au>KOMOV ANATOLIJ P,SU</au><au>KORNYSHEV ANATOLIJ P,SU</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>METHOD AND DEVICE FOR ANALYZED ELEMENT SPECIMEN ANALYTICAL LINE SEPARATION FROM HE BACKGROUND OF INTERFERING LINES</title><date>1981-06-30</date><risdate>1981</risdate><oa>free_for_read</oa></addata></record>
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source esp@cenet
subjects INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
title METHOD AND DEVICE FOR ANALYZED ELEMENT SPECIMEN ANALYTICAL LINE SEPARATION FROM HE BACKGROUND OF INTERFERING LINES
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-04T09%3A28%3A26IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=KRAMPIT%20IGOR%20A,SU&rft.date=1981-06-30&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3ESU842523A1%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true