METHOD OF DETERMINING THICKNESS OF SURFACED METAL LAYERS

Bibliographische Detailangaben

Hauptverfasser:	KOTOVA GALINA A,SU, POPOV GRIGORIJ ,SU, TSURGANOV STANISLAV V,SU
Format:	Patent
Sprache:	eng
Schlagworte:	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS TESTING
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