METHOD OF DETERMINING THE TEMPERATURE OF LOCAL OVERHEATING ZONE OF TRANSISTOR STRUCTURE

METHOD OF DETERMINING THE TEMPERATURE OF LOCAL OVERHEATING ZONE OF TRANSISTOR STRUCTURE

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Hauptverfasser: MININ VIKTOR F,SU, PERELMAN BENIAMIN L,SU, KERNER BORIS S,SU, DOROSHENKO LYUBOV G,SU
Format: Patent
Sprache:eng
Schlagworte:
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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creator MININ VIKTOR F,SU
PERELMAN BENIAMIN L,SU
KERNER BORIS S,SU
DOROSHENKO LYUBOV G,SU
description
format Patent
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subjects MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
title METHOD OF DETERMINING THE TEMPERATURE OF LOCAL OVERHEATING ZONE OF TRANSISTOR STRUCTURE
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