LINEAR DISPLACEMENT TRANSDUCER

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Bibliographische Detailangaben
Hauptverfasser:	SYROEZHKIN EVGENIJ V,SU, AITOV IRSHAT L,SU, ZHDANOVSKIKH MIKHAIL A,SU, RAKHMATULLIN SALAVAT F,SU, MUFAZALOV FUAT SH,SU
Format:	Patent
Sprache:	eng
Schlagworte:	ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR PHYSICS TARIFF METERING APPARATUS TESTING
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