DEVICE FOR PREDICTING CONTROL SYSTEM STATE

Bibliographische Detailangaben

Hauptverfasser:	STROKOV IVAN P,SU, AVDEEV VITALIJ P,SU, STOLYAR VLADIMIR A,SU, DUBOVIK VALERIJ YA,SU, ZELTSER SAMOIL R,SU
Format:	Patent
Sprache:	eng
Schlagworte:	ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR PHYSICS TARIFF METERING APPARATUS TESTING
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