CHAMBER FOR X-RAY STRUCTURE ANALYSIS OF CRYSTALS

CHAMBER FOR X-RAY STRUCTURE ANALYSIS OF CRYSTALS

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Hauptverfasser: YUSHIN VALENTIN D,SU, SKRYABIN VALENTIN G,SU, KOLEROV OLEG K,SU, LOGVINOV ANATOLIJ N,SU
Format: Patent
Sprache:eng
Schlagworte:
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
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creator YUSHIN VALENTIN D,SU
SKRYABIN VALENTIN G,SU
KOLEROV OLEG K,SU
LOGVINOV ANATOLIJ N,SU
description
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subjects INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
title CHAMBER FOR X-RAY STRUCTURE ANALYSIS OF CRYSTALS
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