METHOD OF MEASURING MUTUAL SHIFT OF TWO SYSTEMS OF INTERFERENCE BANDS IN WHITE LIGHT

Bibliographische Detailangaben

Hauptverfasser:	NIKITENKO NIKOLAJ F,SU, ARLOV BORIS L,SU, SYCHEVA TATYANA A,SU, GOLOVANOV VLADIMIR ,SU, GUJVAN ANATOLIJ G,SU, KUKSA NIKOLAJ N,SU
Format:	Patent
Sprache:	eng
Schlagworte:	MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS TESTING
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