CAPACITIVE METHOD OF MEASURING THE COATING THICKNESS OF CONDUCTIVE BASES

Bibliographische Detailangaben

Hauptverfasser:	FEDOROVA ALEKSANDRA N,SU, OVCHARENKO VIKTOR I,SU, KOROLEVA ELENA V,SU, MACHEVSKAYA RAKHIL A,SU, STUPIN VALERIJ P,SU, UTKINA ELENA S,SU
Format:	Patent
Sprache:	eng ; rus
Schlagworte:	MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS TESTING
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