EDDY-CURRENT METER OF THICKNESS OF DIELECTRIC COATINGS

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Hauptverfasser: SAVIN ALEKSEJ N,SU, SHCHETININ MIKHAIL I,SU, FEDOSENKO YURIJ K,SU, SHUBAEV STANISLAV N,SU
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creator SAVIN ALEKSEJ N,SU
SHCHETININ MIKHAIL I,SU
FEDOSENKO YURIJ K,SU
SHUBAEV STANISLAV N,SU
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fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_SU1592773A1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>SU1592773A1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_SU1592773A13</originalsourceid><addsrcrecordid>eNrjZDBzdXGJ1HUODQpy9QtR8HUNcQ1S8HdTCPHwdPb2cw0OBnFcPF19XJ1DgjydFZz9HUM8_dyDeRhY0xJzilN5oTQ3g4Kba4izh25qQX58anFBYnJqXmpJfHCooamlkbm5saOhMRFKAMU1J6g</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>EDDY-CURRENT METER OF THICKNESS OF DIELECTRIC COATINGS</title><source>esp@cenet</source><creator>SAVIN ALEKSEJ N,SU ; SHCHETININ MIKHAIL I,SU ; FEDOSENKO YURIJ K,SU ; SHUBAEV STANISLAV N,SU</creator><creatorcontrib>SAVIN ALEKSEJ N,SU ; SHCHETININ MIKHAIL I,SU ; FEDOSENKO YURIJ K,SU ; SHUBAEV STANISLAV N,SU</creatorcontrib><language>eng ; rus</language><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; MEASURING ANGLES ; MEASURING AREAS ; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS ; MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS ; PHYSICS ; TESTING</subject><creationdate>1990</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=19900915&amp;DB=EPODOC&amp;CC=SU&amp;NR=1592773A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,778,883,25551,76302</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=19900915&amp;DB=EPODOC&amp;CC=SU&amp;NR=1592773A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>SAVIN ALEKSEJ N,SU</creatorcontrib><creatorcontrib>SHCHETININ MIKHAIL I,SU</creatorcontrib><creatorcontrib>FEDOSENKO YURIJ K,SU</creatorcontrib><creatorcontrib>SHUBAEV STANISLAV N,SU</creatorcontrib><title>EDDY-CURRENT METER OF THICKNESS OF DIELECTRIC COATINGS</title><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASURING</subject><subject>MEASURING ANGLES</subject><subject>MEASURING AREAS</subject><subject>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</subject><subject>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>1990</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZDBzdXGJ1HUODQpy9QtR8HUNcQ1S8HdTCPHwdPb2cw0OBnFcPF19XJ1DgjydFZz9HUM8_dyDeRhY0xJzilN5oTQ3g4Kba4izh25qQX58anFBYnJqXmpJfHCooamlkbm5saOhMRFKAMU1J6g</recordid><startdate>19900915</startdate><enddate>19900915</enddate><creator>SAVIN ALEKSEJ N,SU</creator><creator>SHCHETININ MIKHAIL I,SU</creator><creator>FEDOSENKO YURIJ K,SU</creator><creator>SHUBAEV STANISLAV N,SU</creator><scope>EVB</scope></search><sort><creationdate>19900915</creationdate><title>EDDY-CURRENT METER OF THICKNESS OF DIELECTRIC COATINGS</title><author>SAVIN ALEKSEJ N,SU ; SHCHETININ MIKHAIL I,SU ; FEDOSENKO YURIJ K,SU ; SHUBAEV STANISLAV N,SU</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_SU1592773A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; rus</language><creationdate>1990</creationdate><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASURING</topic><topic>MEASURING ANGLES</topic><topic>MEASURING AREAS</topic><topic>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</topic><topic>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>SAVIN ALEKSEJ N,SU</creatorcontrib><creatorcontrib>SHCHETININ MIKHAIL I,SU</creatorcontrib><creatorcontrib>FEDOSENKO YURIJ K,SU</creatorcontrib><creatorcontrib>SHUBAEV STANISLAV N,SU</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>SAVIN ALEKSEJ N,SU</au><au>SHCHETININ MIKHAIL I,SU</au><au>FEDOSENKO YURIJ K,SU</au><au>SHUBAEV STANISLAV N,SU</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>EDDY-CURRENT METER OF THICKNESS OF DIELECTRIC COATINGS</title><date>1990-09-15</date><risdate>1990</risdate><oa>free_for_read</oa></addata></record>
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recordid cdi_epo_espacenet_SU1592773A1
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subjects INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
MEASURING ANGLES
MEASURING AREAS
MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS
PHYSICS
TESTING
title EDDY-CURRENT METER OF THICKNESS OF DIELECTRIC COATINGS
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-15T14%3A10%3A20IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=SAVIN%20ALEKSEJ%20N,SU&rft.date=1990-09-15&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3ESU1592773A1%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true