EDDY-CURRENT METER OF THICKNESS OF DIELECTRIC COATINGS

Bibliographische Detailangaben

Hauptverfasser:	SAVIN ALEKSEJ N,SU, SHCHETININ MIKHAIL I,SU, FEDOSENKO YURIJ K,SU, SHUBAEV STANISLAV N,SU
Format:	Patent
Sprache:	eng ; rus
Schlagworte:	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS TESTING
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