DEVICE FOR AUTOMATIC INSPECTION OF LARGE INTEGRATED CIRCUITS

Bibliographische Detailangaben

Hauptverfasser:	MALSHIN ALEKSANDR V,SU, KARE YULIJ A,SU, MAKSIMOV SERGEJ A,SU, REJNBERG MIKHAIL G,SU, KRASNOVA LYUDMILA S,SU, METELKINA MARGARITA G,SU, YAROSLAVTSEV OLEG I,SU, BURGASOV MIKHAIL A,SU, CHUNAEV VALENTIN S,SU, PESHKOV MIKHAIL V,SU
Format:	Patent
Sprache:	eng ; rus
Schlagworte:	CALCULATING COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
Online-Zugang:	Volltext bestellen
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!