STAND FOR MEASURING THICKNESS OF COMPENSATING PIECES IN ASSEMBLING REDUCTION UNITS

Bibliographische Detailangaben

Hauptverfasser:	VARDASHKIN BORIS N,SU, KHARITONOV VALERIJ I,SU, BULAVIN IGOR A,SU, GRUZDEV ALEKSANDR YU,SU, LOSEV ALEKSANDR D,SU, VORONIN ALEKSEJ V,SU, BEGYAN ALEKSANDR S,SU
Format:	Patent
Sprache:	eng ; rus
Schlagworte:	MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS TESTING
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