METHOD OF REJECTING INRELIABLE COMPLEMENTARY METAL-OXIDE SEMICONDUCTOR INTEGRATED CIRCUITS
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| creator | MALKOV YAKOV V,SU MOLODYK ALEKSANDR M,SU PETROV SERGEJ P,SU BRAZHNIKOVA ELENA V,SU BARKOV ALEKSANDR G,SU DMITRIEV ANDREJ A,SU ZNAMENSKAYA TATYANA D,SU KALENIK GENNADIJ P,SU SIZOV YURIJ A,SU |
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| fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_SU1239658A1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>SU1239658A1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_SU1239658A13</originalsourceid><addsrcrecordid>eNqNyz0KwkAQQOE0FqLeYS6QIgZFy3V2kozsj-xOINqEIGslGoj3xxQewOo131tmN0vSeA2-gkBnQmFXA7tAhtXJEKC3F0OWnKhwhRkrk_uONUEky-idblF8mBehOighDcgBW5a4zhaP4Tmlza-rDCoSbPI0vvs0jcM9vdKnj22xLY_73UEV5R_kCyL0MgA</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>METHOD OF REJECTING INRELIABLE COMPLEMENTARY METAL-OXIDE SEMICONDUCTOR INTEGRATED CIRCUITS</title><source>esp@cenet</source><creator>MALKOV YAKOV V,SU ; MOLODYK ALEKSANDR M,SU ; PETROV SERGEJ P,SU ; BRAZHNIKOVA ELENA V,SU ; BARKOV ALEKSANDR G,SU ; DMITRIEV ANDREJ A,SU ; ZNAMENSKAYA TATYANA D,SU ; KALENIK GENNADIJ P,SU ; SIZOV YURIJ A,SU</creator><creatorcontrib>MALKOV YAKOV V,SU ; MOLODYK ALEKSANDR M,SU ; PETROV SERGEJ P,SU ; BRAZHNIKOVA ELENA V,SU ; BARKOV ALEKSANDR G,SU ; DMITRIEV ANDREJ A,SU ; ZNAMENSKAYA TATYANA D,SU ; KALENIK GENNADIJ P,SU ; SIZOV YURIJ A,SU</creatorcontrib><language>eng ; rus</language><subject>BASIC ELECTRIC ELEMENTS ; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ; ELECTRICITY ; MEASURING ; MEASURING ELECTRIC VARIABLES ; MEASURING MAGNETIC VARIABLES ; PHYSICS ; SEMICONDUCTOR DEVICES ; TESTING</subject><creationdate>1986</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=19860623&DB=EPODOC&CC=SU&NR=1239658A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=19860623&DB=EPODOC&CC=SU&NR=1239658A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>MALKOV YAKOV V,SU</creatorcontrib><creatorcontrib>MOLODYK ALEKSANDR M,SU</creatorcontrib><creatorcontrib>PETROV SERGEJ P,SU</creatorcontrib><creatorcontrib>BRAZHNIKOVA ELENA V,SU</creatorcontrib><creatorcontrib>BARKOV ALEKSANDR G,SU</creatorcontrib><creatorcontrib>DMITRIEV ANDREJ A,SU</creatorcontrib><creatorcontrib>ZNAMENSKAYA TATYANA D,SU</creatorcontrib><creatorcontrib>KALENIK GENNADIJ P,SU</creatorcontrib><creatorcontrib>SIZOV YURIJ A,SU</creatorcontrib><title>METHOD OF REJECTING INRELIABLE COMPLEMENTARY METAL-OXIDE SEMICONDUCTOR INTEGRATED CIRCUITS</title><subject>BASIC ELECTRIC ELEMENTS</subject><subject>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</subject><subject>ELECTRICITY</subject><subject>MEASURING</subject><subject>MEASURING ELECTRIC VARIABLES</subject><subject>MEASURING MAGNETIC VARIABLES</subject><subject>PHYSICS</subject><subject>SEMICONDUCTOR DEVICES</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>1986</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNqNyz0KwkAQQOE0FqLeYS6QIgZFy3V2kozsj-xOINqEIGslGoj3xxQewOo131tmN0vSeA2-gkBnQmFXA7tAhtXJEKC3F0OWnKhwhRkrk_uONUEky-idblF8mBehOighDcgBW5a4zhaP4Tmlza-rDCoSbPI0vvs0jcM9vdKnj22xLY_73UEV5R_kCyL0MgA</recordid><startdate>19860623</startdate><enddate>19860623</enddate><creator>MALKOV YAKOV V,SU</creator><creator>MOLODYK ALEKSANDR M,SU</creator><creator>PETROV SERGEJ P,SU</creator><creator>BRAZHNIKOVA ELENA V,SU</creator><creator>BARKOV ALEKSANDR G,SU</creator><creator>DMITRIEV ANDREJ A,SU</creator><creator>ZNAMENSKAYA TATYANA D,SU</creator><creator>KALENIK GENNADIJ P,SU</creator><creator>SIZOV YURIJ A,SU</creator><scope>EVB</scope></search><sort><creationdate>19860623</creationdate><title>METHOD OF REJECTING INRELIABLE COMPLEMENTARY METAL-OXIDE SEMICONDUCTOR INTEGRATED CIRCUITS</title><author>MALKOV YAKOV V,SU ; MOLODYK ALEKSANDR M,SU ; PETROV SERGEJ P,SU ; BRAZHNIKOVA ELENA V,SU ; BARKOV ALEKSANDR G,SU ; DMITRIEV ANDREJ A,SU ; ZNAMENSKAYA TATYANA D,SU ; KALENIK GENNADIJ P,SU ; SIZOV YURIJ A,SU</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_SU1239658A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; rus</language><creationdate>1986</creationdate><topic>BASIC ELECTRIC ELEMENTS</topic><topic>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</topic><topic>ELECTRICITY</topic><topic>MEASURING</topic><topic>MEASURING ELECTRIC VARIABLES</topic><topic>MEASURING MAGNETIC VARIABLES</topic><topic>PHYSICS</topic><topic>SEMICONDUCTOR DEVICES</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>MALKOV YAKOV V,SU</creatorcontrib><creatorcontrib>MOLODYK ALEKSANDR M,SU</creatorcontrib><creatorcontrib>PETROV SERGEJ P,SU</creatorcontrib><creatorcontrib>BRAZHNIKOVA ELENA V,SU</creatorcontrib><creatorcontrib>BARKOV ALEKSANDR G,SU</creatorcontrib><creatorcontrib>DMITRIEV ANDREJ A,SU</creatorcontrib><creatorcontrib>ZNAMENSKAYA TATYANA D,SU</creatorcontrib><creatorcontrib>KALENIK GENNADIJ P,SU</creatorcontrib><creatorcontrib>SIZOV YURIJ A,SU</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>MALKOV YAKOV V,SU</au><au>MOLODYK ALEKSANDR M,SU</au><au>PETROV SERGEJ P,SU</au><au>BRAZHNIKOVA ELENA V,SU</au><au>BARKOV ALEKSANDR G,SU</au><au>DMITRIEV ANDREJ A,SU</au><au>ZNAMENSKAYA TATYANA D,SU</au><au>KALENIK GENNADIJ P,SU</au><au>SIZOV YURIJ A,SU</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>METHOD OF REJECTING INRELIABLE COMPLEMENTARY METAL-OXIDE SEMICONDUCTOR INTEGRATED CIRCUITS</title><date>1986-06-23</date><risdate>1986</risdate><oa>free_for_read</oa></addata></record> |
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| subjects | BASIC ELECTRIC ELEMENTS ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS SEMICONDUCTOR DEVICES TESTING |
| title | METHOD OF REJECTING INRELIABLE COMPLEMENTARY METAL-OXIDE SEMICONDUCTOR INTEGRATED CIRCUITS |
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