METHOD OF REJECTING INRELIABLE COMPLEMENTARY METAL-OXIDE SEMICONDUCTOR INTEGRATED CIRCUITS

Bibliographische Detailangaben

Hauptverfasser:	MALKOV YAKOV V,SU, MOLODYK ALEKSANDR M,SU, PETROV SERGEJ P,SU, BRAZHNIKOVA ELENA V,SU, BARKOV ALEKSANDR G,SU, DMITRIEV ANDREJ A,SU, ZNAMENSKAYA TATYANA D,SU, KALENIK GENNADIJ P,SU, SIZOV YURIJ A,SU
Format:	Patent
Sprache:	eng ; rus
Schlagworte:	BASIC ELECTRIC ELEMENTS ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS SEMICONDUCTOR DEVICES TESTING
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