METHOD OF GENERATING IMAGE IN SCANNING ELECTRON-BEAM PROBE SYSTEMS

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Hauptverfasser:	SPIVAK GRIGORIJ V,SU, GOSTEV ALEKSANDR V,SU, RAU EDUARD I,SU
Format:	Patent
Sprache:	eng ; rus
Schlagworte:	BASIC ELECTRIC ELEMENTS ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS ELECTRICITY MANUFACTURE OR TREATMENT OF NANOSTRUCTURES MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES NANOTECHNOLOGY PERFORMING OPERATIONS SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES TRANSPORTING
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creator	SPIVAK GRIGORIJ V,SU GOSTEV ALEKSANDR V,SU RAU EDUARD I,SU
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format	Patent
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subjects	BASIC ELECTRIC ELEMENTS ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS ELECTRICITY MANUFACTURE OR TREATMENT OF NANOSTRUCTURES MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES NANOTECHNOLOGY PERFORMING OPERATIONS SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES TRANSPORTING
title	METHOD OF GENERATING IMAGE IN SCANNING ELECTRON-BEAM PROBE SYSTEMS
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