DEVICE FOR MEASURING THICKNESS OF COMPENSATOR IN TWO DIAMETRICALLY OPPOSITE POINTS

DEVICE FOR MEASURING THICKNESS OF COMPENSATOR IN TWO DIAMETRICALLY OPPOSITE POINTS

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Hauptverfasser: ZOTOV ALEKSEJ M,SU, PETROV VADIM V,SU, ROGOZNYJ ALEKSANDR I,SU
Format: Patent
Sprache:eng
Schlagworte:
MEASURING
MEASURING ANGLES
MEASURING AREAS
MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS
PHYSICS
TESTING
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creator ZOTOV ALEKSEJ M,SU
PETROV VADIM V,SU
ROGOZNYJ ALEKSANDR I,SU
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subjects MEASURING
MEASURING ANGLES
MEASURING AREAS
MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS
PHYSICS
TESTING
title DEVICE FOR MEASURING THICKNESS OF COMPENSATOR IN TWO DIAMETRICALLY OPPOSITE POINTS
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