METHOD OF DECREASING DEFECTIVENESS OF DOUBLE-LAYER DIELECTRIC IN CONDUCTOR-SILICON NITRIDE-SILICON OXIDE- SEMICONDUCTOR STRUCTURE

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Hauptverfasser: Mal'tsev A.I, Chernyshev Ju.R, Miloshevskij V.A, Tjul'kin V.M, Nagin A.P
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creator Mal'tsev A.I
Chernyshev Ju.R
Miloshevskij V.A
Tjul'kin V.M
Nagin A.P
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subjects BASIC ELECTRIC ELEMENTS
ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
SEMICONDUCTOR DEVICES
title METHOD OF DECREASING DEFECTIVENESS OF DOUBLE-LAYER DIELECTRIC IN CONDUCTOR-SILICON NITRIDE-SILICON OXIDE- SEMICONDUCTOR STRUCTURE
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