DEVICE FOR ANALYZING DENSITY OF SAMPLE

Bibliographische Detailangaben

Hauptverfasser:	BOGDANOV KIRILL M,SU, PANTELEEV BORIS P,SU, YANOVSKIJ KARL A,SU, MASLOVA GALINA I,SU, ZARUBINA INESSA L,SU, KOZLOV YURIJ G,SU, MAMAEV ANATOLIJ I,SU, MAKAROV YURIJ K,SU, SHIKHER VLADIMIR I,SU, MARKELOV VYACHESLAV A,SU, KULAKOV ALEKSEJ A,SU
Format:	Patent
Sprache:	eng
Schlagworte:	ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS MEASURING MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR PHYSICS TARIFF METERING APPARATUS TESTING
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