OPHTHOELECTRONIC INTERFEROMETER FOR CHECKING OPTICAL PART SURFACE SHAPE

Bibliographische Detailangaben

Hauptverfasser:	ARAEV IVAN P,SU, ZAGULYAEV ALEKSEJ V,SU, GORSHKOV VLADIMIR A,SU, VORONINA VALENTINA I,SU, KUZNETSOV YURIJ A,SU, GALIULIN RAVIL M,SU, FOMIN OLEG N,SU, PUSHECHNIKOV VALENTIN P,SU, GUZMAN VLADIMIR E,SU, KRYAKHTUNOV VLADIMIR S,SU, GORLOV SERGEJ N,SU, LOZBENEV EVGENIJ I,SU
Format:	Patent
Sprache:	eng
Schlagworte:	MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS TESTING
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