METHOD FOR POLISHING A SEMICONDUCTOR WAFER

The method involves providing a disk (5) made of semiconductor material on both front and rear sides between upper and lower polishing plates (8) that are supported with hard and light compressible polishing cloth (1). Distance between the upper and lower polishing plates, and an upper surface (2) o...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: ALEXANDER HEILMAIER, LESZEK MISTUR, VLADIMIR DUTSCHKE, KLAUS RÖTTGER, TORSTEN OLBRICH, MAKOTO TABATA
Format: Patent
Sprache:eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:The method involves providing a disk (5) made of semiconductor material on both front and rear sides between upper and lower polishing plates (8) that are supported with hard and light compressible polishing cloth (1). Distance between the upper and lower polishing plates, and an upper surface (2) of the polishing cloth stays in contact with disk to be polished. A polishing gap extends from an inner edge of the polishing cloth to an outer edge of the polishing cloth, where height of the polishing gap at the inner edge differs from a height of the polishing gap at the outer edge.