METHOD OF SEARCHING FOR PARAMETERIZED CONTOURS FOR COMPARING IRISES

METHOD OF SEARCHING FOR PARAMETERIZED CONTOURS FOR COMPARING IRISESThe subject of the invention is a method for detecting outlines for iris comparison. It comprises a step of selecting (301, 401, 402) N candidate outlines of circular form (403, 404, 405, 406) by applying a circle search technique to...

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Hauptverfasser: LEFEVRE, THIERRY, DORIZZI, BERNADETTE, GARCIA, SONIA, LEMPERIERE, NADEGE
Format: Patent
Sprache:eng
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Zusammenfassung:METHOD OF SEARCHING FOR PARAMETERIZED CONTOURS FOR COMPARING IRISESThe subject of the invention is a method for detecting outlines for iris comparison. It comprises a step of selecting (301, 401, 402) N candidate outlines of circular form (403, 404, 405, 406) by applying a circle search technique to an image of edges of an iris (300). It also comprises a step of 5 optimizing (302, 504, 505, 506, 507) the form and the position of the N candidate outlines, the optimized candidate outlines being determined by using parametric models, a set of parameters being determined for each candidate outline by minimizing a quantity of energy E(C). The method alsocomprises a step of selecting (303, 604) the best optimized candidate outline 10 (605).Reference: Figure 3