ADAPTIVE PATTERNING FOR PANELIZED PACKAGING

An adaptive patterning method and system for fabricating panel based package structures is described. Misalignment for individual device units in a panel or reticulated wafer may be adjusted for by measuring the position of each individual device unit and forming a unit-specific pattern over each of...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: SCANLAN, CHRISTOPHER, OLSON, TIM
Format: Patent
Sprache:eng
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Beschreibung
Zusammenfassung:An adaptive patterning method and system for fabricating panel based package structures is described. Misalignment for individual device units in a panel or reticulated wafer may be adjusted for by measuring the position of each individual device unit and forming a unit-specific pattern over each of the respective device units.