INSPECTION OF DEFECTS IN A CONTACT LENS

INSPECTION OF DEFECTS IN A CONTACT LENSA method and system for inspecting a clear and printed contact lens is provided. Thecontact lens is inspected by illuminating the contact lens using bright field illumination andlow angle dark field illumination simultaneously, when the contact lens is disposed...

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Bibliographische Detailangaben
Hauptverfasser: POH YEW TIAN, VERTOPRAKHOV VICTOR, WEI WONG SOON
Format: Patent
Sprache:eng
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Beschreibung
Zusammenfassung:INSPECTION OF DEFECTS IN A CONTACT LENSA method and system for inspecting a clear and printed contact lens is provided. Thecontact lens is inspected by illuminating the contact lens using bright field illumination andlow angle dark field illumination simultaneously, when the contact lens is disposed in acavity between a male mold and a female mold. Further, the light emerging from thecontact lens is received by an imaging optical system, and a camera uses the light receivedby the imaging optical system to capture an image of the contact lens. Further, a dataprocessing system is configured to identify dark defects in the image that are in a firstportion of dynamic range of brightness and identify bright defects in the image that are in asecond portion of the dynamic range of brightness.Reference figure: FIG. 5