DUAL REDUNDANT FAULT TOLERANT ELECTRONIC SYSTEM AND METHOD

Embodiments of the present invention provide a fault tolerant system for electronic components, the system comprising: a first Versa Module Eurocard (VME) module located within a housing; and a second Versa Module Eurocard (VME) module located within the housing; wherein the first and second VME modules are functionality. Each of the first and second modules may be located on a single backplane. Each of the first and second modules may further include: a plurality of card slots; a CPU card in one of the plurality of card slots; an input/output (I/O) card in one of the card slots and at least one input/output (I/O) channel providing an external connection to the system, the I/O channel being electrically connected to a plurality of user defined I/O connections on each of the VME modules.