PROBE BASED INFORMATION STORAGE FOR PROBES USED FOR OPENS DETECTION IN IN- CIRCUIT TESTING

PROBE BASED INFORMATION STORAGE FOR PROBES USED FOR OPENS DETECTION IN IN- CIRCUIT TESTING

Disclosed is a novel electrical probe that stores probe-specific information. A probe implemented in accordance with the invention includes a processor, memory, and a communications interface. Probe-specific information such as a probe identifier and/or calibration parameters that affect the true va...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: CROOK DAVID T, TESDAHL CURTIS A
Format: Patent
Sprache:eng
Schlagworte:
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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Beschreibung
Zusammenfassung:Disclosed is a novel electrical probe that stores probe-specific information. A probe implemented in accordance with the invention includes a processor, memory, and a communications interface. Probe-specific information such as a probe identifier and/or calibration parameters that affect the true value of a measurement are stored in the probe memory. The probe-specific information may be retrieved by the processor from the probe memory via the communications interface.