PIEZOOPTISK METOMVANDLARE OCH ACCELEROMETER, TRYCKMETARE, DYNAMOMETER OCH TERMOMETER PA BASIS AV NEMNDA OMVANDLARE

In the path of the second part beam (B) to the second photo-receiver (13), in a second photo-elastic channel (15) there are, in front of the elastic element (4) a second polariser (3) and, after the elastic element, a second analyser (11). There is a device (8, 9), introduced into the beam path, whi...

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Bibliographische Detailangaben
Hauptverfasser:	MIRONOV J V, BELITSKY G M, KAPLINSKAYA N L, SLEZINGER I I, SHIRYAEV V A
Format:	Patent
Sprache:	swe
Schlagworte:	ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS DEVICES OR ARRANGEMENTS, THE OPTICAL OPERATION OF WHICH ISMODIFIED BY CHANGING THE OPTICAL PROPERTIES OF THE MEDIUM OF THEDEVICES OR ARRANGEMENTS FOR THE CONTROL OF THE INTENSITY,COLOUR, PHASE, POLARISATION OR DIRECTION OF LIGHT, e.g.SWITCHING, GATING, MODULATING OR DEMODULATING FREQUENCY-CHANGING INDICATING PRESENCE, ABSENCE, OR DIRECTION, OF MOVEMENT MEASURING MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER,MECHANICAL EFFICIENCY, OR FLUID PRESSURE MEASURING LINEAR OR ANGULAR SPEED, ACCELERATION, DECELERATION,OR SHOCK MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR MEASURING QUANTITY OF HEAT MEASURING TEMPERATURE NON-LINEAR OPTICS OPTICAL ANALOGUE/DIGITAL CONVERTERS OPTICAL LOGIC ELEMENTS OPTICS PHYSICS TARIFF METERING APPARATUS TECHNIQUES OR PROCEDURES FOR THE OPERATION THEREOF TESTING THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
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Beschreibung
Zusammenfassung:	In the path of the second part beam (B) to the second photo-receiver (13), in a second photo-elastic channel (15) there are, in front of the elastic element (4) a second polariser (3) and, after the elastic element, a second analyser (11). There is a device (8, 9), introduced into the beam path, which varies the intensity of the light striking the second photo-receiver in the direction opposite to that for the light striking the first photo-receiver (12). This device can have phase plates (8, 9) which are inserted between polariser and analyser. These plates can have different thicknesses.