DEVICE FOR MEASURING PARAMETERS OF CRYSTALLIZATION KINETICS

FIELD: measurement technology.SUBSTANCE: invention relates to investigation of phase changes of substance and is intended for measurement of growth rate of crystals and rate of formation of crystallization centers during crystallization of melt or during formation of crystals from solution. Disclose...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	Kalinin Sergej Aleksandrovich, Lyashenko Evgenij Yurevich, Solovev Yurij Aleksandrovich, Taran Yuliya Aleksandrovna, Solovev Aleksandr Alekseevich
Format:	Patent
Sprache:	eng ; rus
Schlagworte:	AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUSPOLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE APPARATUS THEREFOR CHEMISTRY CRYSTAL GROWTH INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING METALLURGY PHYSICS PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITHDEFINED STRUCTURE REFINING BY ZONE-MELTING OF MATERIAL SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITHDEFINED STRUCTURE SINGLE-CRYSTAL-GROWTH TESTING UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL ORUNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL
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