DEVICE FOR OBTAINING ELECTRON MICROSCOPIC IMAGE AND LOCAL ELEMENT ANALYSIS OF RADIOACTIVE SAMPLE BY ELECTRON MICROSCOPY IN RADIATION PROTECTION CHAMBER

FIELD: optics.SUBSTANCE: invention relates to scanning electron microscopes (SEM) and is intended for obtaining an electron microscope image and local elemental analysis of a radioactive sample in a radiation protection chamber with data visualization on a computer screen. Essence of the invention l...

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Hauptverfasser:	Kiryukhin Vyacheslav Evgenevich, Zhukov Andrej Viktorovich, Ulyanenkov Aleksandr Georgievich, Makarychev Vyacheslav Vladimirovich, Fomin Aleksandr Nikolaevich, Vlasenko Vyacheslav Sergeevich, Sobolev Aleksej Aleksandrovich, Svetukhin Vyacheslav Viktorovich
Format:	Patent
Sprache:	eng ; rus
Schlagworte:	MEASUREMENT OF NUCLEAR OR X-RADIATION MEASURING PHYSICS TESTING
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