DIAGNOSTIC METHOD OF RIEMANNIAN CURVATURE OF NANOTHIN CRYSTALS LATTICE

FIELD: nanotechnology.SUBSTANCE: method of diagnosing the Riemann curvature of the nanothin crystal lattice includes obtaining electron microscopic image of nanothin crystal in the bright field, getting of micro electron-diffraction pattern from the crystal, micro diffractive study of nanothin crystal, analysis of rotational curvature of the nanothin crystal lattice . At the nanothin crystal electron microscopic image select the physical point M and a two-dimensional direction, for that, select the pair - nonlinear bending extinction contours and the corresponding to it reflex at the micro electron-diffraction pattern, feeling azimuthal broadening; perform diagnosing of nanothin crystal lattice Riemann geometry at a given point M, and this two-dimensional direction, specified by bivector (a, b) - a pair of non-collinear vectors, starting from a single point, which coincides with the center of the micro electron-diffraction pattern, received from nanothin crystal, located in the micro electron-diffraction pattern plane, where the vector b corresponds to the broaden reflex, by the joint analysis of a pair - nonlinear bending extinction contour, presented in the electron-microscopic image of the crystal in the dark field, and corresponding to it reflex at the micro electron-diffraction pattern of the crystal, for determining the continuity of the reflex azimuthal broadening and continuity of the corresponding to it bending contour, then carry out the diagnosing of the Riemann curvature of the nanothin crystal lattice, by means of determining the numerical value of Riemann curvature of the nanothin crystal lattice in the given point M and given two-dimensional direction, specified by bivector (a, b), according to definite formula.EFFECT: to provide the possibility of reliable, accurate and express method of diagnostics of the nanothin crystal lattice Riemann curvature .6 dwg, 4 tbl Использование: для диагностики римановой кривизны решетки нанотонких кристаллов. Сущность изобретения заключается в том, что способ диагностики римановой кривизны решетки нанотонких кристаллов включает получение электронно-микроскопического изображения нанотонкого кристалла в светлом поле, получение микроэлектронограммы от кристалла, микродифракционное исследование нанотонкого кристалла, анализ ротационного искривления решетки нанотонкого кристалла, при этом на электронно-микроскопическом изображении нанотонкого кристалла выбирают физическую точку M и двумерное направление, для этог