APPARATUS FOR INSPECTING QUALITY PARAMETERS OF FLAT OPTICAL COMPONENTS ARRANGED AT ANGLE TO OPTICAL AXIS

FIELD: physics.SUBSTANCE: apparatus for inspecting the quality of flat optical components arranged at an angle to an optical axis consists of a transmitting channel, which includes a radiation source which forms two beams lying at a distance from each other with mutually perpendicular linear polaris...

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Bibliographische Detailangaben

Hauptverfasser:	GLADYSHEVA JANA VLADIMIROVNA, ABDULKADYROV MAGOMED ABDURAZAKOVICH, DENISOV DMITRIJ GENNAD'EVICH, PATRIKEEV VLADIMIR EVGEN'EVICH, BARYSHNIKOV NIKOLAJ VASIL'EVICH, ZHIVOTOVSKIJ IL'JA VADIMOVICH
Format:	Patent
Sprache:	eng ; rus
Schlagworte:	MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS TESTING
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