METHOD OF PROFILING ASPHERICAL POLISHED SURFACE

FIELD: physics.SUBSTANCE: profile of a polished aspherical surface of a large optical component is measured using a linear three-point spherometer with an additional lateral height-adjustable leg, which is nullified in a reference aspherical mirror; installing the spherometer with outermost legs per...

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Bibliographische Detailangaben

Hauptverfasser:	ABDULKADYROV MAGOMED ABDURAZAKOVICH, PATRIKEEV VLADIMIR EVGEN'EVICH, SHAROV JURIJ ANATOL'EVICH, SEMENOV ALEKSANDR PAVLOVICH
Format:	Patent
Sprache:	eng ; rus
Schlagworte:	MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS TESTING
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