METHOD FOR X-RAY DIFFRACTION CONTROL OF PART

FIELD: measurement equipment.SUBSTANCE: X-ray picture is taken off a controlled part, a parameter is determined, which depends on part running time, at the same time X-ray picture taking off the controlled part on the suggested surface of damage is carried out from the reflecting plane (11.0) withou...

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Bibliographische Detailangaben

Hauptverfasser:	KOCHETKOV VLADIMIR ANDREEVICH, PORTER ALEKSANDR MARKOVICH, JABLOKOV ALEKSEJ VLADIMIROVICH, SEMENOVA IRINA VIKTOROVNA, KOVALENKO OL'GA VLADIMIROVNA, JABLOKOVA NATAL'JA ALEKSANDROVNA, VINOGRADOV ALEKSANDR IVANOVICH
Format:	Patent
Sprache:	eng ; rus
Schlagworte:	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING
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