METHOD OF TESTING RELIABILITY OF INFRARED MULTI-ELEMENT PHOTODETECTOR

FIELD: physics. ^ SUBSTANCE: invention is designed for testing reliability of infrared multi-element photodetectors in which the matrix of photosensitive elements is placed inside a sealed housing, docked with a multiplexer or raster using conducting indium micro-columns, and its operating temperatu...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	JAKOVLEVA NATAL'JA IVANOVNA, DEGTJAREV EVGENIJ IVANOVICH, SOLODKOV ALEKSEJ ARKAD'EVICH, BOLTAR' KONSTANTIN OLEGOVICH, PATRASHIN ALEKSANDR IVANOVICH, BURLAKOV IGOR' DMITRIEVICH
Format:	Patent
Sprache:	eng ; rus
Schlagworte:	BASIC ELECTRIC ELEMENTS ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS SEMICONDUCTOR DEVICES TESTING
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